Roushdey Salh

Contact

Works as

Staff scientist at Department of Physics Section: REAL

Fysikhuset plan 2, Linneausväg 20, 2-0422 dg club, 901 87 dg club

New insights into structural and spectroscopic characteristics of Cu²⁺ doped β-Ca₃(PO₄)₂: correlation between Cu²⁺ concentration and material properties

Materials & design, Elsevier 2025, Vol. 252

Elbashir, Sana; Salh, Roushdey; Andersson, Britt M.

Journal of Physics D: Applied Physics, Institute of Physics Publishing (IOPP) 2024, Vol. 57, (38)

Das, Lakshmi; Canto-Aguilar, Esdras J.; Tapani, Tlek; et al.

Frontiers in Chemistry, Frontiers Media S.A. 2024, Vol. 12

Wang, Tianxiao; Li, Menghong; Gu, Ziyan; et al.

Optics Express, The Optical Society 2022, Vol. 30, (3) : 4374-4380

Muschet, Alexander A.; de Andres, Aitor; Fischer, Peter; et al.

High Intensity Lasers and High Field Phenomena: Conference Proceedings 2022

Muschet, Alexander; de Andres Gonzalez, Aitor; Fischer, Peter; et al.

Nano Select, John Wiley & Sons 2022, Vol. 3, (9) : 1344-1353

Segervald, Jonas; Boulanger, Nicolas; Salh, Roushdey; et al.

Optics Express, Vol. 29 : 4210-4218

Fischer, Peter; Muschet, Alexander; Lang, Tino; et al.

2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021

Fischer, Peter; Muschet, Alexander; Lang, Tino; et al.

OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS): Methods for Pushing High Average Power Laser Frontiers (HM2B)

Fischer, Peter; Nagy, Gergely; Muschet, Alexander; et al.

Fuel processing technology, Elsevier 2019, Vol. 193 : 282-294

Grimm, Alejandro; Etula, Jarkko; Salh, Roushdey; et al.

Optics Letters, Optical Society of America 2019, Vol. 44, (16) : 4028-4031

Smijesh, N.; Zhang, Xiaoying; Fischer, Peter; et al.

Ultrafast Optics 2019: Abstract Book, SPIE 2019 : 22-25

Smijesh, Nadarajan; Zhang, Xiaoying; Fischer, Peter; et al.

Physical Review & Research International, Sciencedomain international 2013, Vol. 3, (2) : 42-54

Salh, Roushdey

Crystalline Silicon: Properties and Uses, Rijeka: InTech 2011 : 173-218

Salh, Roushdey

Crystalline Silicon: Properties and Uses, Rijeka: InTech 2011 : 135-172

Salh, Roushdey

Journal of Non-Crystalline Solids, Elsevier 2011, Vol. 357 : 1044-1050

Salh, Roushdey

Journal of Atomic, Molecular, and Optical Physics, Hindawi Publishing Corporation 2011, Vol. 2011 : 326368-

Salh, Roushdey

Solid State Phenomena, Vol. 156-158 : 529-533

Fitting, H-J; Fitting Kourkoutis, L; Salh, Roushdey; et al.

Silicon nanocluster aggregation in SiO₂:Si layers

Physica status solidi. A, Applied research, Vol. 207, (1) : 117-123

Fitting, H-J; Fitting Kourkoutis, L; Salh, Roushdey; et al.

Journal of Luminescence, Vol. 130 : 399-403

Matoussi, A; Ben Nasr, F; Boufaden, T; et al.

Physica. E, Low-Dimensional systems and nanostructures, Vol. 41 : 454-459

Ben Nasr, Férid; Matoussi, Adel; Salh, Roushdey; et al.

EFTEM EELS and Cathodoluminescence in Si-implanted SiO₂ layers

Microscopy and Microanalysis, Vol. 15, (S2) : 1104-1105

Fitting, H.-J.; Fitting-Kourkoutis, L.; Salh, Roushdey; et al.

Instrumentation and Methodology, Vol. 1 : 129-130

Fitting, H.-J.; Fitting-Kourkoutis, L.; Salh, Roushdey; et al.

Journal of Non-Crystalline Solids, Vol. 355 : 1107-1110

Salh, Roushdey; Kourkoutis, L.; Zamoryanskaya, M. V.; et al.

Superlattices and Microstructures, Vol. 45 : 362-368

Salh, Roushdey; Kourkoutis, L.; Zamoryanskaya, M. V.; et al.

Physics Procedia, Vol. 2 : 467-478

Salh, Roushdey; Kourkoutis, L.; Zamoryanskaya, M. V.; et al.

Journal of Physics: Condensed Matter, Vol. 21, (46) : 464115-

Wette, Patrick; Engelbrecht, Andreas; Salh, Roushdey; et al.

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science : 17-18

Fitting, H.-J.; Salh, Roushdey; Kourkoutis, L.; et al.

Journal of Non-Crystalline Solids, Vol. 354 : 1697-1702

Fitting, H.-J.; Salh, Roushdey; Schmidt, B.

Materials letters (General ed.), Vol. 62 : 515-519

Matoussi, A.; Ben Nasr, F.; Salh, Roushdey; et al.

FUNDAMENTAL AND APPLIED SPECTROSCOPY: Second International Spectroscopy Conference, ISC 2007, American Institute of Physics (AIP) 2007 : 65-71

Ben Nasr, F.; Matoussi, A.; Salh, Roushdey; et al.

Journal of Electron Spectroscopy and Related Phenomena, Vol. 159 : 46-52

Fitting, H.-J.; Cornet, N.; Salh, Roushdey; et al.

Microscopy and Microanalysis, Vol. 13, (S02) : 1378-1379

Fitting, H.-J.; Salh, Roushdey; Fitting Kourkoutis, L.

Journal of Luminescence, Vol. 122-123 : 743-746

Fitting, H.-J.; Salh, Roushdey; Schmidt, B.

Semiconductors, Pleiades publishing 2007, Vol. 41 : 453-457

Fitting, H.-J.; Salh, Roushdey; Schmidt, B.

Mechanism of Radiation-Induced defects in SiO₂: The Role of Hydrogen

Physica Status Solidi. C, Current topics in solid state physics, Vol. 4 : 901-904

Salh, Roushdey; Fitting, H.-J.

Microscopy and Microanalysis, Vol. 13, (S03) : 328-329

Salh, Roushdey; Fitting Kourkoutis, L.; Schmidt, B.; et al.

Luminescence of isoelectronically ion-implanted SiO₂ layers

Physica status solidi. A, Applied research, Vol. 204 : 3132-3144

Salh, Roushdey; Fitting Kourkoutis, L.; Schmidt, B.; et al.

Semiconductors, Vol. 41 : 397-402

Salh, Roushdey; Fitting, L.; Kolesnikova, E. V.; et al.

Journal of Non-Crystalline Solids, Vol. 353 : 546-549

Salh, Roushdey; von Czarnowski, A.; Fitting, H.-J.

Microscopy and Microanalysis, Vol. 12, (S02) : 1532-1533

Salh, Roushdey; Fitting, Lena; Fitting, H.-J.

Cathodoluminescence of SiO_x under-stoichiometric silica layers

Physica status solidi. A, Applied research, Vol. 203 : 2049-2057

Salh, Roushdey; von Czarnowski, A.; Zamoryanskaya, M. V.; et al.

Physica status solidi. A, Applied research, Vol. 202 : R142-R144

Fitting, H.-J.; Salh, Roushdey; Barfels, T.; et al.

Luminescent Defect Dynamics in Amorphous SiO₂:H

Physica Status Solidi. C, Current topics in solid state physics, Vol. 2 : 693-698

Fitting, H.-J.; Ziems, T.; Salh, Roushdey; et al.

Journal of Non-Crystalline Solids, Vol. 351 : 2251-2262

Fitting, H.-J.; Ziems, T.; Salh, Roushdey; et al.

Time-resolved VUV luminescence spectroscopy of SiO₂-layers implanted with Ge ions

HASYLAB, Annual Report, Vol. Part I : 707-708

Pustovarov, V. A.; Zatsepin, A. F.; Kortov, V. S.; et al.

Multiplet luminescence of sulfur implanted silica – SiO₂:S

Physica status solidi. A, Applied research, Vol. 202 : R53-R55

Salh, Roushdey; Schmidt, B.; Fitting, H.-J.

Electron Beam Induced Defects in Ge-implanted SiO₂Layers

Physica Status Solidi. C, Current topics in solid state physics, Vol. 2 : 580-583

Salh, Roushdey; von Czarnowski, A.; Fitting, H.-J.

Fischer, Peter; Muschet, Alexander; de Andres Gonzalez, Aitor; et al.

Research groups

Group member

Ludvig Edman lab

RElativistic Attosecond Physics Laboratory (REAL)

Research projects

1 January 2021 until 31 December 2024

Nonlinear attosecond spectroscopy

1 January 2020 until 31 December 2025

Relativistic nanophotonics